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Instruments (TuMRIC)
​With our equipment it is possible to investigate different kinds of materials, like solids in the form of thin films, bulks and powders as well as gas phases. For example, problems related to the composition of the material or to the changes in the material due to structural imperfections can be investigated. Introduction to our equipments and research methods are given below and the detailed list of the instruments can be found here. Please contact us, if you need more information or if you would like to hear what we can offer for your research project!

The instruments for structural characterization forms the largest group of instruments in the TuMRIC, since the structural properties serves as the basis for other characteristics of the material. In the TuMRIC facility, the surface structure of the sample can be investigated with several methods such as Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), Low Energy Electron Diffraction (LEED) and Scanning Electron Microscope (SEM). With our X-ray Photoelectron
Spectroscopy (XPS) and the Auger Electron Spectroscopy (AES) we can gain  information of the surface layers of the sample including the element composition and the chemical state of the elements. The X-ray Diffraction (XRD) with the options for powder, bulk and thin film samples is also available in the TuMRIC facility to obtain information of e.g. the crystal structure, phase purity, texturing of the investigated materials. We can also determine the hardness, the density, the surface area and the pore size of the porous materials using the Hardness Tester, the Density Analyzer and Nitrogen Adsorbtion Measurements, respectively. Also, the Zeta-Potential Measurements and Dynamic Light Scattering (DLS) can also be carried out in the TuMRIC facility.

Magnetic and magnetotransport properties of the materials can be investigated with our SQUID- and PPMS-magnetometers. With these magnetometers we can measure for example the critical current density of a superconductor, colossal magneto-resistance effect in a manganite film or basic hysteresis loops and M(T)-curves, which define the magnetic characteristics of the material. Magnetic characterization can be carried out in the temperature range of 2-800 K and in magnetic fields up to 9 T. In addition, we can measure the Electron Paramagnetic Resonance (EPR), which can be used to investigate materials with unpaired electrons.

Gas phase samples can be investigated in the TuMRIC with Ion TOF Spectrometer, VUV Electron Spectrometer and Photoelectron Photoion Coincidence Spectroscopy (PEPICO), which can be used to collect information about the fragmentation (due to UV radiation) of molecules and composition of variety of samples.

In the TuMRIC facility, we also have equipments for the optical and thermal analysis. We have the Optical Polarization Microscope and FT-IR Spectrometer to optically investigate the sample and gain information of the sample composition. With the Isothermal Microcalorimeter (IMC), Differential Scanning Calorimeter (DSC) and Thermogravimeter, we can perform diverse monitoring and analysis of different chemical and physical processes.
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