Edwin
Kukk
Professor, Materials Research Laboratory
Professor, Head of Materials Research Laboratory

Contact

+358 29 450 4281
+358 50 339 6892
Vesilinnantie 5
20500
Turku

Areas of expertise

Synchrotron radiation
free-electron-lasers
ion mass spectroscopy
electron spectroscopy
coincidence spectroscopy
molecular dynamics
photoionization
photodissociation
ultrafast processes
femtochemistry
radiation damage
molecular structure;

Research

My research is focussed on fundamental studies of the interaction of small quantum systems (such as molecules, multimers of biomolecules, small clusters) with light -- x-rays and ionizing UV radiation.The ultrafast processes that occur in the femtosecond-scale following the absorption of energy are the key for understanding many phenomena such as radiation damage in DNA and other biomolecules, light-activated processes (such as vision or many catalytic processes) but also the action and efficiency of radiosensitizing agents in cancer therapy.

Our research is based on advanced spectroscopic methods such as multiparticle coincidence spectroscopy, actively utilizing large international infrastructures: SACLA free-electron laser in Japan,  EuXFEL in Germany, MAX-IV synchrotron in Sweden. We are also active in designing and building new instruments for these facilities. The research is carried out withing the framework of large international collaborations, closely involving also theoretical calculations and modeling.

Publications

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Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays (2020)

International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC), Journal of Physics: Conference Series
Niozu A., Kumagai Y., Nishiyama T., Fukuzawa H., Motomura K., Bucher M., Ito Y., Takanashi T., Asa K., Sato Y., You D., Li Y., Ono T., Kukk E., Miron C., Neagu L., Callegari C., Fraia M.D., Rossi G., Galli D.E., Pincelli T., Colombo A., Kameshima T., Joti Y., Hatsui T., Owada S., Katayama T., Togashi T., Tono K., Yabashi M., Matsuda K., Bostedt C., Nagaya K., Ueda K., Ueda K., Nagaya K.
(Muu (O2))

Opportunities for Two-Color Experiments in the Soft X-ray Regime at the European XFEL (2020)

Applied Sciences
Svitozar Serkez, Winfried Decking, Lars Froehlich, Natalia Gerasimova, Jan Grünert, Marc Guetg, Marko Huttula, Suren Karabekyan, Andreas Koch, Vitali Kocharyan, Yauhen Kot, Edwin Kukk, Joakim Laksman, Pavel Lytaev, Theophilos Maltezopoulos, Tommaso Mazza, Michael Meyer, Evgeni Saldin, Evgeny Schneidmiller, Matthias Scholz, Sergey Tomin, Maurizio Vannoni, Torsten Wohlenberg, Mikhail Yurkov, Igor Zagorodnov, Gianluca Geloni
(Vertaisarvioitu alkuperäisartikkeli tai data-artikkeli tieteellisessä aikakauslehdessä (A1))

Multi-particle momentum correlations extracted using covariance methods on multiple-ionization of diiodomethane molecules by soft-X-ray free-electron laser pulses (2020)

Physical Chemistry Chemical Physics
You D, Fukuzawa H, Luo Y, Saito S, Berholts M, Gaumnitz T, Huttula M, Johnsson P, Kishimoto N, Myllynen H, Nemer A, Niozu A, Patanen M, Pelimanni E, Takanashi T, Yokono N, Wada SI, Tono K, Owada S, Nagaya K, Yabashi M, Ueda K, Kukk E
(Vertaisarvioitu alkuperäisartikkeli tai data-artikkeli tieteellisessä aikakauslehdessä (A1))

Photo-ionization and fragmentation of Sc3N@C-80 following excitation above the Sc K-edge (2019)

Journal of Chemical Physics
Razib Obaid, Kirsten Schnorr, Thomas J. A. Wolf, Tsukasa Takanashi, Nora G. Kling, Kuno Kooser, Kiyonobu Nagaya, Shin-ichi Wada, Li Fang, Sven Augustin, Daehyun You, Eleanor E. B. Campbell, Hironobu Fukuzawa, Claus P. Schulz, Kiyoshi Ueda, Pascal Lablanquie, Thomas Pfeifer, Edwin Kukk, Nora Berrah
(Vertaisarvioitu alkuperäisartikkeli tai data-artikkeli tieteellisessä aikakauslehdessä (A1))

Two colors at the SASE3 line of the European XFEL: Project scope and first measurements (2019)

International Free-Electron Laser Conference
Serkez S., Geloni G., Gerasimova N., Grünert J., Karabekyan S., Koch A., Laksman J., Maltezopoulos T., Mazza T., Meyer M., Tomin S., Decking W., Froehlich L., Kocharyan V., Kot Y., Saldin E., Schneidmiller E., Scholz M., Yurkov M., Zagorodnov I., Huttula M., Kukk E.
(Vertaisarvioitu artikkeli konferenssijulkaisussa (A4))